Reference: Yoshikawa K, et al. (2011) Comprehensive phenotypic analysis of single-gene deletion and overexpression strains of Saccharomyces cerevisiae. Yeast 28(5):349-61

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Abstract

We quantified the growth behaviour of all available single-gene deletion and overexpression strains of budding yeast. Genome-wide analyses enabled the extraction of the genes and identification of the functional categories for which genetic perturbation caused the change of growth behaviour. Statistical analyses revealed defective growth for 646 deletion and 1302 overexpression strains. We classified these deleted and overexpressed genes into known functional categories, and identified several functional categories having fragility and robustness for cellular growth. We also screened the deletion and overexpression strains that exhibited a significantly higher growth rate than the strain without genetic perturbation, and found that three deletion and two overexpression strains were high-growth strains. The genes and functional categories identified in the analysis might provide useful information on designing industrially useful yeast strains. Copyright (c) 2011 John Wiley & Sons, Ltd.CI - Copyright (c) 2011 John Wiley & Sons, Ltd.

Reference Type
Journal Article
Authors
Yoshikawa K, Tanaka T, Ida Y, Furusawa C, Hirasawa T, Shimizu H
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